Products & ReviewSpectroscopy
SDCOM XRD
Malvern PanalyticalAvailable: Worldwide
Ultra-fast, flexible crystal orientation in a compact package.
Request Pricing
Receive your quote directly from the manufacturer.
Able to measure crystals starting from 1 mm in size, the SDCOM uses the azimuthal scan method to precisely determine the complete lattice orientation of single crystals in just one measuring rotation – taking only a few seconds. Suitable for both research and production quality control, the versatile and accessible SDCOM fits easily into a wide range of wafer and ingot process steps and does not require water cooling.
