SDCOM XRD by Malvern Panalytical

Manufacturer Malvern Panalytical  |  Available Worldwide
Ultra-fast, flexible crystal orientation in a compact package.


SDCOM XRD by Malvern Panalytical product image
SDCOM XRD
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Able to measure crystals starting from 1 mm in size, the SDCOM uses the azimuthal scan method to precisely determine the complete lattice orientation of single crystals in just one measuring rotation – taking only a few seconds. Suitable for both research and production quality control, the versatile and accessible SDCOM fits easily into a wide range of wafer and ingot process steps and does not require water cooling.