Manufacturer JEOL USA
Multipurpose Analytical S/TEM

JEM-F200  by JEOL USA product image
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The JEM-F200 "F2" is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a cold field emission gun, quad-lens condenser system, and dual large-area silicon drift detectors for high speed EDS analysis. The F2 employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical S/TEM. This multipurpose workhorse instrument yields analytical results not found in other non aberration-corrected S/TEMs.