Helios™ 5 Laser PFIB by Thermo Fisher Scientific
Manufacturer Thermo Fisher Scientific | Available Worldwide
This system delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining. Featuring an innovative, fully integrated femtosecond laser, it offers the fastest material removal rate with the highest cut face quality.
Helios™ 5 Laser PFIB
Average Rating: 4.7
3 Scientists have reviewed this product
Status:
Reviewer
Member since: 2019
Organization: Delft University of Technology (TU Delft)
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- Ease of use
- After sales service
- Value for money
Great technique and very user friendly.
Rating: 5.0
Application Area: University
"Very nice and great instrument for materials science applications to see cross sections and for mechanical testing."
Review date: 19 Jul 2021 | Helios™ 5 Laser PFIB
Status:
Reviewer Member since: 2020
Organization: Institute of Scientific Instruments of the CAS
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- Ease of use
- After sales service
- Value for money
Great results so far.
Rating: 4.3
Review date: 02 Feb 2021 | Helios™ 5 Laser PFIB
Application Area:Electron microscopy
"Great FIB-SEM system, powerful. Great results. Easy to use, however, it needs much time for training."
Review date: 02 Feb 2021 | Helios™ 5 Laser PFIB
Status:
Reviewer Member since: 2020
Organization: National Institute for Materials Science
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- Ease of use
- After sales service
- Value for money
This is an important milestone that opens up a new category of electron microscopy.
Rating: 4.7
Review date: 24 Dec 2020 | Helios™ 5 Laser PFIB
Application Area:Analytical sciences
"This product challenges the new technology of electron microscopy. Technical support is also very generous."
Review date: 24 Dec 2020 | Helios™ 5 Laser PFIB
Features
- Fastest material removal for millimeter-scale cross sections with a material removal rate up to 15,000x faster than a typical Ga + FIB
- Statistically relevant subsurface and 3D data analysis by acquiring much larger volumes within a shorter amount of time
- Accurate and repeatable cut placement with triple beamcoincidence on the sample
- Fast characterization of deep subsurface features via extraction of subsurface TEM lamella or chunks for 3D analysis
- High-throughput processing of challenging materials such as non-conductive or ion beam-sensitive
- Fast and easy characterization of air-sensitive samples without the need to transfer samples between different instruments for imaging and cross-sectioning
- All capabilities of proven Helios 5 PFIB platform, including highest quality Ga-free TEM and APT sample preparation and extreme high-resolution imaging capabilities
Product Overview
Helios™ 5 Laser PFIB
Manufacturer Thermo Fisher Scientific | Available Worldwide
4.7 / 5.0 | 3 reviews
