Empyrean Alpha 1 - XRD
Unrivalled data quality from a laboratory XRD system
Very good and service is strong
Drug particles size test
The Malvern XRPD is very good and service is strong.
Review Date: 10 Dec 2024 | Malvern Panalytical
Empyrean Alpha-1 is configured with a unique symmetric Ge monochromator (Johansson type) giving perfect Cu or Co Kα1-only Bragg-Brentano reflection geometry data for structure determination, with unrivaled resolution, excellent peak symmetry, and ultra-low backgrounds.
Thanks to the PreFIX concept on the tube housing, users can easily swap between Kα1-only configuration to Kα1,2 in a matter of minutes.
Engineered to be the best
The Empyrean Alpha-1 is a member of Malvern Panalytical’s family of Empyrean X-ray diffraction systems. In the Alpha-1, a unique symmetric Johansson monochromator provides data with unrivalled resolution, excellent peak symmetry, and ultra-low background - perfect for structural analysis needs.
Brochures
Empyrean brochure
This product brochure introduces the Empyrean by Malvern Panalytical, the intelligent diffractometer.
Grating-coupled interferometry – the weak fragment hit biosensor assay
Grating-coupled interferometry (GCI) is ideally suited for fragment-based drug discovery due to inherent sensitivity of the detection principle, and the ability to capture fast transitions. It uses the refractive index changes that occur with protein binding and are measured as time-dependent phase-shift signals. Explore how the Creoptix® WAVEsystem combines GCI with innovative no-clog microfluidics, permitting the study of biomolecular interactions using crude, unpurified samples, or in complex matrices, such as serum, plasma, or cell supernatant. The WAVEsystem uses a robust sensor and microfluidics cartridge, the WAVEchip®, with four parallel flow channels, available in different surface matrix chemistries suitable for diverse applications, such as protein, antibody, VLPs, lipids, and others.
XRD of gallium nitride and related compounds: strain, composition and layer thickness
In this white paper, Malvern Panalytical provides an introduction to the X-ray diffraction analysis of key structural parameters in epitaxial GaN layers. Fundamental crystallographic concepts are introduced and related to the specific requirements of the technological structures created for optoelectronic and electronic devices employing GaN and related compounds.



















