PIPS II System
Precision ion polishing system for precise centering, control, and reproducibility of your milling process.
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I would definitely recommend this ion mill from Gatan, it's very versatile with cooling possibilities. The service from Gatan is very good, it's easy to contact them both over the phone and in person as well. All different kinds of samples can be polished (oxides, superconductors, materials). PIPS gives excellent results on all material families. Also, plane view and FIB samples are possible.
Review Date: 15 Oct 2012 | Gatan Inc.
The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS Ion Mill System which has defined the standard for TEM sample preparation for 20 years.
The PIPS II system incorporates the patented WhisperLok® with the X,Y positioning stage for precise centering of the milling target. The PIPS II system incorporates a 10 inch touch screen for ease of use and increased control and reproducibility of the milling process.
The Digital Zoom Microscope monitors the polishing process in real time and the color images can be stored in Gatan’s DigitalMicrograph® software for review and analysis while the sample is in the TEM.
Features & Benefits:
- WhisperLok with X, Y stage - Ability to center the region of interest for re-polish.
- Low energy focusing Penning Ion Guns - Improved low energy milling FIB prepared samples.
- Variable energy from 100 V to 8.0 kV - Improved low energy milling for reduction in amorphous layer for correct TEMs.
- LN2 specimen cooling - Eliminates artifacts 10 inch color touch screen control - Simple but full control from the graphical user interface (GUI).
- Digital Zoom Microscope - Operates in real time while milling.
- Color image storage in DigitalMicrograph - Ability to store and use optical images with the TEM EELS data in the same format.
Argon Ion Polishing of Focused Ion Beam Specimens in PIPS II System
This application note discusses broad argon beam ion milling and focused ion beam milling using the PIPS II System. These two most common techniques are used for preparation of electron transparent specimens for a diverse class of materials, including semiconductors, metals and ceramics.
STEM Imaging Using the Digiscan System
Gatan Inc. explain Electron energy loss spectroscopy (EELS) with a tutorial on STEM imaging.
Lamella Recipe for The PIPS II System
The team from Gatan Inc. show you how to set up the lamella cleaning recipe for the PIPS II system.
Lamella Alignment On The PIPS II System
In this video Gatan show Lamella alignment using the X, Y stage prior to ion polishing on the PIPS II system. See more about Gatan here.
Ready, Set, Go! Ensuring an Identical TEM Specimen Preparation Route Again and Again
By Anahita Pakzad, Gatan, Inc., Steven Granz and Adam Wise, Carnegie Mellon University, Pittsburgh, PA, USA
Argon Ion Polishing of Focused Ion Beam Specimens in PIPS II System
By Anahita Pakzad, Gatan, Inc.
