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BeVision D3 Series

Bettersize Instruments LtdAvailable: Worldwide

An advanced, fully automated analyzer based on Dynamic Image Analysis (DIA) technology.

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Description

Comprehensive particle characterization

High-resolution imaging enables reliable detection of oversized and undersized particles while supporting analysis of difficult materials, including flaky and elongated particles. Specialized capabilities measure particle thickness, length, and width, and perform mixture analysis. Results are fully comparable with sieve analysis.

Standardized, efficient testing

Compliance with ISO 13322-2 and ISO 9276 supports standardized and repeatable particle analysis. Verification with National Institute of Standards and Technology (NIST)-traceable standards further strengthens measurement confidence. Automated operation reduces human error, while typical test times of approximately three minutes and minimal maintenance help laboratories streamline demanding workflows.

Key features and benefits of BeVision D3 Series:

  • Measures particle sizes across a broad 0.5 μm to 26 mm range
  • Reports more than 37 particle size and morphology parameters
  • Characterizes flaky, elongated, oversized, and undersized particles
  • Delivers sieve-comparable results with ISO-compliant, NIST-traceable verification
  • Automates testing in around three minutes with minimal maintenance

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