Electron Microscopy

Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

Rating

(32)

& Up (59)

& Up (60)

& Up (61)

& Up (61)

Featured Brands

HORIBA Scientific (2)

Leica Microsystems (11)

SPT Labtech (1)

ZEISS Research Microscopy Solutions (13)

WITec GmbH (1)

Agar Scientific Ltd (1)

ASPEX, LLC (1)

Bruker-Nano (2)

E.A. Fischione Instrumental Inc. (6)

EDAX International, Inc. (1)

Electron Microscopy Sciences (2)

Gatan Inc. (5)

Hitachi High Technologies America, Inc. (18)

Hitachi High-Technologies Corp (Microscopy) (2)

JEOL USA (31)

Olympus IMS (1)

Oxford Instruments Inc. (4)

Oxford Instruments NanoAnalysis (7)

Protochips (1)

Raith Nanofabrication (1)

Scienion (1)

Shinkuu (1)

Ted Pella Inc. (4)

Tescan (3)

Thermo Fisher Scientific (38)

ZEISS Research Microscopy Solutions (13)


Showing 1 - 25 of 158 results

Sort by

Product Image

JCM-7000 NeoScope Benchtop SEM

JEOL USA



Product Image

Ultim® Max and AZtecLive

Oxford Instruments NanoAnalysis



Product Image

JSM-IT200

(1)

JEOL USA



Product Image

Symmetry® S2

(1)

Oxford Instruments NanoAnalysis



Product Image

Ultim® Extreme

(2)

Oxford Instruments NanoAnalysis



Product Image

chameleon

SPT Labtech



Product Image

JSM-IT700HR

JEOL USA



Product Image

Ultim® Max and AZtecTEM

Oxford Instruments NanoAnalysis



Product Image

Xplore EDS detector

Oxford Instruments NanoAnalysis



Product Image

SU8000 Series UHR Cold-Emission FE-SEM

(3)

Hitachi High Technologies America, Inc.



Product Image

Ultra-high Resolution Scanning Electron Microscope S-5500

(3)

Hitachi High-Technologies Corp (Microscopy)



Product Image

Product Image

TM3030

(1)

Hitachi High Technologies America, Inc.



Product Image

SU3500 Premium VP-SEM

(1)

Hitachi High Technologies America, Inc.



Product Image

SU8200 Series CFE SEM

(1)

Hitachi High Technologies America, Inc.



Product Image

X-act - 10mm2 SDD Detector

(2)

Oxford Instruments Inc.



Product Image

Product Image

Talos™ F200C TEM

(1)

Thermo Fisher Scientific



Product Image

Krios™ G3i Cryo-TEM for Life Sciences

(1)

Thermo Fisher Scientific



Product Image

Helios™ 5 Laser PFIB

(3)

Thermo Fisher Scientific



Product Image

S-3400N Fully Automated VP SEM

(2)

Hitachi High Technologies America, Inc.



Product Image

SEM Specimen Stubs

(2)

Agar Scientific Ltd



Product Image

Talos F200i for Materials Science

(2)

Thermo Fisher Scientific



Product Image

Quattro E SEM

(2)

Thermo Fisher Scientific