Atomic Force Microscopy / Scanning Tunneling Microscopy Products & Reviews

High-Resloution Atomic Force Microscope for academic and industrial large sample research and failure analysis

Atomic force microscope with built-in white light interferometry profilometry (WLI) for semiconductor and related applications 

Park NX-Mask is the most effective, safe and efficient Photomask Repair System for High-end EUV Mask Repairs.

Regardless of sample size, the Keysight 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner. The 5600LS utilizes a fully addressable 200mm x 200mm stage and a new, low-noise design. Samples up to 8”…

The Keysight 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The system’s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images. The Keysight 5500 ILM offers unparalleled performance an…

Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which re…

The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. 

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. 

The JPK NanoWizard V ® combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters open new possibilities for long-term, self-regulating experiment series.

The ForceRobot ® 400 BioAFM incorporates a number of unique force spectroscopy innovations to measure forces at the single-molecule level. As forces play a crucial role in molecular mechanisms, such as recognition and signaling, this BioAFM is uniquely suited for emerging life science research. It enables the quantification of the mechanical strength of individual molecular bonds and the characterization of the force-dependen…

Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based The Attocube attoMFM I is a compact magnetic force microscope designed particularly for applications at low and ultra low temperature. Based on a conventional atomic force microscope, the attoMFM I instrument works by scanning the sample below a fixed magnetic cantilever. The magnetic force gradient acting on the attoMFM I tip is then determined…

Attocube attoSHPM - Low temperature scanning Hall probe microscope The attoSHPM is a compact scanning Hall probe microscope, designed particularly for operation at low temperature and high magnetic fields. At the heart of the SHPM, a molecular beam epitaxy (MBE) grown GaAs/AlGaAs Hall sensor measures magnetic fields with unrivalled sensitivity. Local measurements of the magnetization of a sample are obtained by scanning the…

Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single mode fiber and a sensing element. The compact design (6 mm long, 3 mm diameter) and the attocube-typical compatibility with extreme environments such as ultra high vacuum und very low temperature open up new possibilities and applications for int…

Attocube Systems Atomic Force Microscopes (AFMs) are designed as complete system solutions, capable of being integrated into virtually any electron microscope currently on the market. The Attocube Systems AFMs offer highest levels of usability and flexibility, enabling scientists to perform high-precision measurements in material science, structural biology, solid state physics, and other fields of nanotechnology. attocube s…

Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with innovative software architecture, offering superior performance and unprecedented variety of control concepts. The Attocube ASC500 SPM controller was developed with the goal to never be the limiting factor in any SPM experiment. All desirable functions…

Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be delivered compatible with low temperatures, ultra high vacuum and magnetic fields. Key Features of the Attocube Systems ANPx101/RES: environments LT; UHV; magnetic field closed loop resolution: ~ 200 nm motion linear stepping & scanning travel…

Attocube Systems ANPx101/NUM PositionerThe ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can be delivered compatible with ultra high vacuum. Key Features of the Attocube Systems ANPx101/NUM  Environments UHV Closed loop resolution: 10 nm Motion linear stepping & scanning Travel 5 mm Resolution sub nm Size 24 x 28 x 14.5 mm Load 100 g Encod…

K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact ProbeThis versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG01AFM-mode non-contact probe:…

K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory. Available Options with the K-TEK NSG03 AFM Mode Non Contact Pr…

K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG10 non-contact AFM probe: -PtIr, TiN, and Au tip coatings -CoCr…

K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG20 AFM non-contact probe: -PtIr, TiN, and Au tip coatings -CoCr mag…

K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG30 AFM Non-Contact Probe: -PtIr, TiN, and Au tip coa…

K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the FMG01 AFM Mode Non-Contact Force Modulation Probe: -PtI…

K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG01 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic ti…