Rigaku will be in attendance at the 19th Norwegian X-RAY Conference, showcasing the company’s latest analytical technology and techniques
New nano3DX optimizes data acquisition enabling the measurement of volumes 25 times larger than other systems in a comparable time frame
Diverse lines of benchtop XRD and XRF spectrometers to be exhibited at ACS Fall 2016.
Bruker introduces new generation of EBSD detectors and software for advanced post-processing and visualization of 3D EBSD/EDS data cubes
New XtaLAB mini II benchtop X-ray crystallography system is optimized for small molecule 3D molecular structure determination
New X-ray microscopy and computed tomography technology to be showcased at conference
Optical Surfaces Ltd. reports on growing demand for specialist reflective beam expanders for high power lasers applications
European launch during “Critical Mass Tour” starting in March
SelectScience® brought a grand piano to the Pittcon show floor for the first time ever
Visit booth 4145 for all this and more
SelectScience® spoke to Dr Chuck Gardner, Program Chair of Pittcon® 2016, to find out his thoughts about the upcoming conference
SelectScience® spoke to Dr Michael Boss, NIST, about his work to improve brain imaging
Which product made the most difference to your research in 2015?
Siemens Healthcare’s Multitom Rax Heralds New Era in Diagnostic Imaging, Says GlobalData Analyst
Rigaku announces the NANOPIX, its latest small angle and wide angle X-ray scattering (SAXS/WAXS) measurement system
Rigaku will be in attendance at 60th Biophysical Society Meeting Saturday, February 27, 2016 to Wednesday, March 2, 2016 Los Angeles, CA, presenting their single crystal and SAXS products at Booth #828
Discover the winning product, voted for by scientists worldwide
Broadening the capability of the most versatile 3D X-ray microscopy instrument
Nominate and review your favorite products
SelectScience® and The Society for Laboratory Automation and Screening form a new partnership
X-ray Innovation and User-friendly Software Boosts Detection Sensitivity
Rigaku Publishes Method for Quantitative Analysis of Ferrosilicon by WDXRF
