Thermo Presents Measurement and Metrology Capabilities for Semiconductor and Related Industries

27 Feb 2006

Product news

Thermo Electron Corporation, the world leader in analytical instrumentation, announces the publication of a new brochure demonstrating its complete range of high performance solutions for the semiconductor, microelectronics and disk storage industry.

This 8-page brochure provides process and defect engineers, as well as production managers, with a quick reference to Thermo’s capability offerings in the fields of plasma mass spectroscopy, FT-IR metrology, Raman microspectroscopy and numerous X-ray spectroscopies including angle-resolved XPS, microbeam XRF and EDS for electron microscopy and defect review.

The new brochure demonstrates Thermo’s expertise in these manufacturing environments with specifically engineered instrumentation in both the support lab, and on the fab floor with near-line and at-line measurement and metrology tools that meet the rigorous demands of production monitoring. The new brochure provides a review of the capabilities, characteristics, benefits and applications of this instrument family, and provides background regarding each instrument’s underlying technique.

As yield management tools to monitor production parameters and locate defects become even more critical to the financial success of the fabrication units, and as wafer sizes grow to 300 mm and feature sizes shrink to 45 nanometers, fast and reliable methods that accurately measure the chemistry and physical dimensions of silicon wafers and packaging are imperative. Thermo offers several proven techniques for the production of semiconductor wafers, microchips, solid state circuitry and microelectronics.

Many of the semiconductor production monitoring tools from Thermo include wafer handling automation built to industry-standard guidelines and feature built-in automated analytical methods tied to production control and an information system. As this brochure demonstrates, Thermo brings research quality instrumentation from the support lab to the fab floor in a variety of industry-leading measurement, metrology and production control solutions.

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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Mass SpectrometryMass spectrometry (MS) is a powerful analytical technique used to identify and quantify molecules based on the mass-to-charge ratio of gas-phase ions. It provides detailed information about the structure, composition, and properties of compounds and is widely used across fields such as environmental monitoring, materials science, drug discovery and development, food and beverage testing, and wider chemical research. Key MS techniques include tandem mass spectrometry (MS/MS), liquid chromatography–mass spectrometry (LS-MS) and inductively coupled plasma (ICP-MS). Choosing from these wide range of techniques and technologies can be a daunting task, so keep up to date with scientific applications, performance expectations, and customer reviews here all in one place. Visit our product directory to receive quotes direct from the manufacturer. X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Environmental Monitoring and TestingEnvironmental monitoring and testing uses handheld portable analyzers, kits, spectrometers or chromatography systems for air, water, soil, food and other sample testing. Useful features of analyzers such as BOD and COD include portability, easy calibration, automation and sensitivity.  Environmental test kits for pH, water, moisture, etc, should be accurate, sensitive, reliable, fast and easy to use.
Thermo Presents Measurement and Metrology Capabilities for Semiconductor and Related Industries