Rigaku Presents Latest X-ray Analytical Solutions at 2018 MRS Fall Meeting

Rigaku will showcase its XRD and XRF instrumentation at the 2018 Materials Research Society Fall Meeting & Exhibit in Boston

26 Nov 2018
Finn Price
Administrator / Office Personnel

Product news

Rigaku Corporation is presenting its diverse lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman spectroscopy instrumentation at the 2018 MRS Fall Meeting and Exhibit, Sunday November 25 to Friday, November 30, 2018. The event is organized by the Materials Research Society and will be held at the Hynes Convention Center and adjacent Sheraton Boston Hotel, in Boston, Massachusetts. Rigaku, a global leader in X-ray analytical instrumentation, will be exhibiting at the event at booth #416.

The conference highlights cross-disciplinary worldwide activity in materials research, gathering researchers from all scientific fields, backgrounds and employment sectors to exchange technical information, engage in broader impact programming, network, and contribute to the advancement of materials research.

Large-scale exhibits are featured, as companies from around the world present innovative products and services to the scientific community, and gather information to develop new products and partnerships that drive innovation.

Rigaku provides the world’s most complete line of X-ray analytical instruments and components, including XRD and XRF systems, X-ray optics and detectors. Materials analysis instrumentation from Rigaku ranges from benchtop devices, suited for researchers employing X-ray techniques, to high-end instruments with advanced analytical capabilities.

Featured at the event will be the sixth generation Rigaku MiniFlex benchtop X-ray diffraction instrument. The MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The instrument is designed to deliver speed and sensitivity through innovative technology enhancements, such as the HyPix-400 MF 2D hybrid pixel array detector (HPAD) coupled with a 600 W X-ray source and new 8-position automatic sample changer.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.X-Ray SourceRaman
Rigaku Presents Latest X-ray Analytical Solutions at 2018 MRS Fall Meeting