Rigaku Features Latest Semiconductor Metrology Solutions at SEMICON West

Rigaku presents its X-ray analytical instrumentation for the semiconductor industry at SEMICON West 2019

9 Jul 2019
Georgina Wynne Hughes
Editorial Assistant

Industry news

Rigaku Corporation have announced its attendance at SEMICON West 2019. SEMICON West is the premier event for the microelectronics industry, highlighting the latest innovations, products, processes, and services for the design and manufacture of the most sophisticated electronics of today. The three-day event, organized by Semiconductor Equipment & Materials Institute connects the entire extended electronics supply chain and takes place Tuesday, July 9 through Thursday, July 11, 2019 at the Moscone Center in San Francisco, California.

Rigaku, a leading supplier of X-ray metrology tools, is showcasing their semiconductor metrology products at booth 746.

Rigaku is a pioneer in designing and manufacturing X-ray based measurement tools to solve semiconductor manufacturing challenges. With over 35 years of global market leadership in the semiconductor industry, Rigaku solutions employ X-ray fluorescence (XRF), diffraction (XRD), and reflectometry (XRR) techniques and enable everything from in-fab process control metrology to R&D for thin film and materials characterization, as well as total-reflection XRF spectrometers (TXRF) with integrated vapor phase decomposition (VPD) for trace contamination monitoring. The Rigaku vacuum products division offers a full line of rotary magnetic fluid feedthroughs.

The Rigaku Semiconductor Division designs and manufactures in-line, high-throughput X-ray monitoring systems for inspection and measurement to meet semiconductor manufacturing challenges, determining critical process parameters such as thin film thickness, composition, roughness, density, porosity, and crystal structure.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Research and DevelopmentHigh ThroughputHigh throughput experiments allow the simultaneous processing of several samples. This parallelization reduces the cost per experiment and increases reproducibility and output volume of data.X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.Metrology
Rigaku Features Latest Semiconductor Metrology Solutions at SEMICON West