Rigaku confirms their leadership in the supply of benchtop analytical X-ray instrumentation with the release of the new SuperMini X-ray fluorescence spectrometer

19 Feb 2008
Greg Smith
Analyst / Analytical Chemist

Product news

Rigaku Americas Corporation continues its long history of innovation in the area of benchtop analytical X-ray equipment, presenting the new SuperMini, a 200 W wavelength dispersive X-ray spectrometer. The SuperMini will be unveiled at Pittcon 2008, Booth 5321.

SuperMini: The world's first high-powered benchtop wavelength dispersive XRF spectrometer

Low levels of detection and exceptional energy resolution are the trademarks of the wavelength dispersive XRF (WDXRF) technique. Traditional high-powered "big iron" WDXRF spectrometers provide the ultimate in lower limit of detection and energy resolution, but have a high cost of ownership and somewhat specialized installation requirements. The 50 W ZSXmini benchtop WDXRF first released by Rigaku in 2001 represented a paradigm shift in the industry, providing many of the benefits of the larger WDXRF machines at a greatly reduced cost, with simplified installation. The release of the higher-powered 200 W SuperMini benchtop system takes the next step by closing the gap in performance while maintaining the benefits of a benchtop machine.

Visit Rigaku at PITTCON 2008, March 3rd-6th in New Orleans, Louisiana, USA, booth 5321.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.