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New Non-Destructive UV Cleaning Process for Electron Microscope Samples

Hitachi High-Tech Europe
6 Dec 2010
Sarah Sarah
Marketing / Sales

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Hitachi High-Technologies launches the ZONESem desktop EM sample cleaner, specifically designed for cleaning and storing electron microscopy samples in readiness for high quality imaging and analysis. The Hitachi ZONESem utilizes a non-destructive UV cleaning process to quickly remove surface hydrocarbons from SEM samples.

The Hitachi ZONESem makes high resolution and/or surface imaging using secondary electrons, backscattered electrons or scanning transmission methods much easier, by removing surface hydrocarbon layers that could cause focusing and astigmatism difficulties and which would obscure surface and edge detail. Samples prepared in this way also offer better results for EDX or WDX analysis and for electron backscatter diffraction (EBSD), where surface contamination can suppress EBSD pattern formation.

The compact Hitachi ZONESem measures just 360mm x 390mm x 480mm and uses a dry pumping system. Fully microprocessor-controlled, it is ready for use in less than 2 minutes and can provide either vacuum cleaning, or vacuum cleaning and vacuum storage. Cleaning times can be controlled in 1-minute steps up to 30 minutes total cleaning time.

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UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MicrobiologyMicrobiology is the study of microorganisms including protists, prokaryotes, fungi, and, often, viruses. Microorganisms are a useful research tool as genetic vectors and, in immunology, for antibiotic susceptibility testing, cellular biology and genetics. Microorganisms commonly grow readily in incubators with microbial culture media; this can contain chromogenic supplements to differentiate between cell lines. Estimate your culture’s density of microorganisms with colony counters, or screen and select colonies for desirable clones with automated colony pickers. Additionally, equipment is available to monitor environments for the presence of microbes and identify with microbial identification instruments. Find the best microbiology products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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New Non-Destructive UV Cleaning Process for Electron Microscope Samples