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New Catalog Features Portfolio of Rigaku X-ray Instruments

Rigaku Corporation
24 Feb 2017
Mia Harley
Biochemist

Product news

Rigaku Americas Corporation has published a new comprehensive catalog featuring its current portfolio of X-ray analytical instrumentation.

Rigaku provides a complete line of analytical and industrial instrumentation covering the full spectrum of X-ray based test and measurement equipment. The new publication presents the company’s entire line of materials analysis systems for the North and South American markets.

The catalog enumerates the company’s X-ray Diffraction (XRD), Wavelength and Energy Dispersive X-ray Fluorescence (XRF), Small Angle X-ray scattering (SAXS) and X-ray Computed Microtomography (μCT) systems. Both full-sized laboratory systems and portable/benchtop systems for use in the field are included.

Analytical techniques enabled by Rigaku technology are suitable for performing rapid non-destructive elemental analysis in all types of samples across a range of industries. Overviews of the principles of the instruments’ respective technologies are presented along with descriptions of the unique capabilities of each system, indicating that Rigaku is able to offer an optimized solution for virtually any kind of X-ray analytical task.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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New Catalog Features Portfolio of Rigaku X-ray Instruments