New Additions to Veeco's Dimension AFM Line at ACS 2010

The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Veeco. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM anywhere else.

Lowest noise, highest resolution Atomic Force Microscope in its classThe Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns. The Integrated AFM-Raman Imaging System (IRIS) Module for Veeco Atomic Force Microscopes enables the seamless blend of AFM and Raman spectroscopy by combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with the most advanced nanoscale mechanical, electrical, and thermal AFM characterization. The IRIS Module supports both the Innova and BioScope™ Catalyst™ AFM Systems, providing combined-technique experiment control for advanced research in both materials and life sciences applications. To create an AFM-Raman spectroscopy system, simply select your AFM platform and add a HORIBA Scientific, Renishaw, or Princeton Instruments Raman microscope. For life sciences applications, you can also add an inverted light microscope from Zeiss, Leica, Olympus or Nikon. However you tailor your system, your application will benefit from the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A major advancement of the world's best-selling, most field-proven SPM platform, the MultiMode 8 SPM features two new patent-pending technologies from Veeco, ScanAsyst™ and PeakForce™ QNM™, as well as a simplified user interface and large single-panel display that enable even novice users to access the most advanced applications and modes. Finally, new NanoScope® Version 8.1 software offers MultiMode 8 users a simplified interface and faster, more powerful tools for data gathering and off-line analysis. These features combine to reaffirm the MultiMode 8 as the most versatile, highest performance SPM in its class. Setting the Standard for High-Performance SPMs with the MultiMode® 8 Scanning Probe Microscope (SPM):• Highest Performance and Resolution • Versatility to Satisfy More Applications • Faster and Easier Expert-Quality Results • World-Renowned Productivity and Reliability