Bruker Announces the New S2 PUMA™ Bench-Top X-ray Fluorescence Spectrometer for Elemental Analysis

10 Mar 2015

Product news

At Pittcon 2015, Bruker is proud to announce the S2 PUMATM bench-top multi-element analyzer. The new S2 PUMA is an energy-dispersive X-ray fluorescence spectrometer (EDXRF) for quantitative analysis of the elemental composition of a large variety of samples from pressed pellets, fused beads, powders to liquids and even large and bulky samples. The S2 PUMA complements the well-established S2 RANGER in Bruker’s bench-top XRF product offerings.

With the S2 PUMA Bruker introduces HighSenseTM technology for EDXRF. Low detection limits and short measurement times are achieved using a high-power X-ray tube. Best-in-class detection of light elements is realized by the combination of optimized excitation, detection and vacuum mode. Expensive purge gases like helium can be avoided assuring low cost of ownership.

The compact and robust design of the S2 PUMA matches the needs of industrial customers in geology, minerals and mining, cement production, metals processing, petro-chemistry and consumer product safety applications. High sample throughput demands are satisfied with either the 20-position EasyLoad™ sample tray or via the automation interface to a conveyor belt. The S2 PUMA is easily integrated into existing or new lab automation systems. Customers with lower sample throughput requirements will benefit from the economic single-loader option of the S2 PUMA.

In addition to its perfect fit for industrial applications, the new S2 PUMA is also a very valuable and flexible tool for the academic and research environment, because it accepts a wide range of sample types, shapes, and sizes. The large flat sample table option accommodates samples up to 16 by 16 inches (~ 40 by 40 cm). The measurement spot can also be changed from a couple of centimeters down to a few millimeters to allow for measurements of small spots on the samples. A video camera is provided for exact sample positioning, and the sample image can be saved along with the XRF measurement data and results for easy reference.

All users will enjoy the instrument’s ease of use. The S2 PUMA comes with an integrated computer and touchscreen without the need for an external PC. Data input and system operation is intuitive with the multilingual TouchControl™ user interface. The S2 PUMA is equipped with a standard TCP/IP port for extended networking needs, data export and interfacing.

“With the S2 PUMA, Bruker offers the most versatile energy-dispersive XRF bench-top spectrometer available on the market. The S2 PUMA can be optimally configured for high sample throughput, automated measurement processes, large samples, small spot sizes, and state-of-the-art light element detection - all integrated into a robust industrial-grade housing. Key benefits are the rugged design, the large sample magazine, and the low cost of ownership. Customers responsible for consumer product safety will find the S2 PUMA’s option to measure large products and work pieces non-destructively extremely useful.” stated Frank Portala, XRF Product Manager of Bruker AXS.

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Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Elemental AnalysisElemental analysis involves determining the elemental composition of a sample, often used in environmental, pharmaceutical, and material sciences. Techniques like ICP-MS, X-ray fluorescence, and atomic absorption spectroscopy allow precise quantification of elements such as metals and nonmetals in complex matrices. Browse our peer-reviewed product directory to find the best elemental analysis tools, compare products, check reviews, and get pricing directly from manufacturers.PittconPittcon is one of the largest conferences and exhibitions dedicated to laboratory science. It brings together professionals and innovators in analytical chemistry, physics, and biology, offering a platform to explore the latest scientific tools and technologies. From cutting-edge laboratory instruments to emerging research trends, Pittcon is a must-attend event for professionals in research and development.