Bruker and DECTRIS have announced the integration of the new EIGER2 R 250K Detector into the D8 X-ray Diffraction Systems

18 Mar 2021
Ellen Simms
Product and Reviews Editor

Bruker Corp., one of the global market leaders in X-ray diffraction (XRD) instrumentation, and DECTRIS, one of the technology leaders in hybrid photon counting (HPC) detectors for laboratory instrumentation and synchrotron beam lines, introduce the EIGER2 R 250K X-ray detector, the latest member in the EIGER2 R series of HPC pixel detectors.

The new EIGER2 R 250K with over 250,000 pixels incorporates the latest technological enhancements applied to the entire EIGER2 R family, such as the doubled dynamical range and the expanded threshold energy range for an even more versatile background reduction. The very high frame rate common to all EIGER2 R detectors enables 2-dimensional data collection in continuous scanning mode and single photon counting without any spatial distortion.

Bruker’s holistic integration of the EIGER2 R 250K and 500K detectors into the D8 ADVANCE and D8 DISCOVER resulted in a powerful yet easy-to-use solution. The seamless integration into the DIFFRAC.SUITE software architecture, the ergonomic design of the X-ray detector mount, and dedicated accessories enable fast and reliable optimization of instrument geometry and efficient data collection for many applications. Bruker’s consistent implementation on 0D, 1D, and 2D data acquisition modes and patented algorithms ensure best data quality for every sample.

Bruker’s D8 ADVANCE™ and D8 DISCOVER™ X-ray diffractometers equipped with the new EIGER2 R 250K detector are extremely versatile tools for materials characterization covering all X-ray applications from powder diffraction (XRPD), micro diffraction (μXRD), texture or residual stress analysis, crystallite size determination, thin film analysis by X-ray reflectometry (XRR) and high-resolution diffraction (HRXRD) to small angle X-ray scattering (SAXS).

Dr. Clemens Schulze-Briese, Vice President and CSO of DECTRIS says, “In particular, our users at the synchrotron keep pushing us for better performance and making the full potential of our leading EIGER2 technology available. For the new EIGER2 R 250K, we have transferred our recent advances into a detector that brings improvements such as an even wider dynamic range and increased energy ranges to the broadest possible audience in the laboratory.”

Dr. Lutz Bruegemann, Bruker AXS Vice President and General Manager XRD & XRM, added, “Users across academia and industry appreciate the intuitive operation and excellent results obtained on our D8 diffraction solutions equipped with EIGER2 500K R detectors. With the expanded EIGER2 R detector line-up and the upgraded HPC detector technology, we are now enabling more customers to use their D8 diffractometer as a true multi-purpose instrument without compromising on data quality.”

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D8 ADVANCE

Bruker AXS Inc.

D8 ADVANCE – The Industry Leader Although the D8 ADVANCE is the top-selling x-ray diffractometer for powder XRD applications, its capabilities reach far into other realms of x-ray diffraction. Facilitating more than 10,000 possible combinations of different x-ray sources, x-ray optics, sample stages, and x-ray detectors, the optimal configuration can always be reached. In addition, the modular design of the D8 ADVANCE enables an easy and straightforward change of configuration. The analytical capabilities can be expanded or simplified. A simple system can be purchased now and upgraded later, allowing for a perfectly cost-efficient x-ray diffraction system. The push-plug optics of the D8 ADVANCE enables a quick switch between the para-focusing Bragg-Brentano geometry to parallel beam geometry without realignment of the system. For the “cut above” standard powder diffraction, the D8 ADVANCE with Vario1 Johansson focusing monochromator features high-flux K-alpha-1 radiation for reflection as well as for foil or capillary transmission experiments. D8 ADVANCE - Sample stage concept The sample stage concept of the D8 ADVANCE allows for many different sample environments. These range from 10 K Helium closed-cycle cryostats up to non-ambient sample conditions with high temperature and humidity. For ambient conditions, the flip-stick sample stage and the auto changer provide the capability of measuring a batch of up to 90 samples in transmission as well as in reflection geometry. Detector technology is an important core competence of Bruker AXS. This means that the D8 ADVANCE can be equipped with the full range of point and linear detectors. According to the analytical requirements, the user can choose between different types of dynamic scintillation counter, energy dispersive Sol-X, or the Super Speed VÅNTEC-1. No matter how the individual diffraction solution is configured, any D8 ADVANCE has the ability to perform a full range of applications, from qualitative and quantitative phase identification, under ambient or non ambient conditions, to crystal structure solution from powder samples, crystallite size determination, micro strain analysis, residual stress analysis, and preferred orientation.

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Bruker and DECTRIS have announced the integration of the new EIGER2 R 250K Detector into the D8 X-ray Diffraction Systems