Application Note: Improving High-Resolution Imaging of Non-Conductive Specimens with Local Charge Compensation
23 July 2018

High-resolution combined with an additional expansion of analytical capabilities is extremely important for many applications in material analysis. With the integration of a charge compensation system, these investigations are not restricted to conductive samples only but can also be executed for all kinds of non-conductive samples. Such a method is demonstrated here in the application note below.