ResourceSpectroscopy

Imaging measurement and particle characterization of microplastics using infrared microscopy

9 Mar 2022

In this application note, JASCO demonstrates the results of particle analysis of microplastics measured with an infrared imaging microscope.

FT/IR-6000 Series FT-IR Spectrometers

JASCO (USA)

The FT/IR-6000 series from JASCO offers advanced capabilities for high performance, research grade FT-IR.The 6000 series attains the highest performance level in its class with exceptional signal to noise ratio (SNR) specifications. All models in the series are designed with flexibility and expandability in mind making them suitable for a wide range of research applications allowing extended measurement from Near to Far-IR regions.

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IRT-7000 FT-IR Microscope

JASCO (USA)

JASCO also offers the IRT-7000, an innovative FT-IR multi-channel microscope accessory with advanced functionality which drastically improves the ability to obtain microspectroscopic data.The IRT-7000 offers two detectors as standard; a 16-channel linear array detector for infrared sample imaging and a single-point MCT detector. The combination of the standard automatic sample stage and "IQ Mapping" function allows mapping analyses of a large sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time. With the combination of the FT/IR-6000 and the step scan option, this system offers an advanced capability for dynamic imaging as well as time-resolved measurements of a specific area. For multivariate analysis, the PCA (Principal Component Analysis) software package is standard. Features IQ Mapping for advanced mapping experiments Rapid IR Imaging experiments Up to four objectives and automated switching Exceptional visual observation quality Wide area mapping and multi-ATR imaging Dynamic Imaging with FT-IR step-scan option Multivariate analysis PCA (Principal Component Analysis)

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Imaging measurement and particle characterization of microplastics using infrared microscopy