High Resolution Imaging of Non-Conductive Specimen Benefits From Local Charge Compensation

7 Jan 2018

In this application note, high-resolution SEM imaging is executed on non-conductive samples by the integration of a charge compensation system.

ZEISS Crossbeam Family

ZEISS Research Microscopy Solutions

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber size, standard or large, that best suits your samples.

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