Product DemonstrationsSpectroscopy

Rigaku Supermini200: Elemental Analysis by X-ray Florescence

19 May 2014
Rigaku Supermini200: Elemental Analysis by X-ray Florescence

Watch this video to learn about the Rigaku Supermini200 WDXRF benchtop spectrometer. Discover features including improved software capabilities, exceptional sensitivity and economical design.

Supermini 200 Benchtop WDXRF Spectrometer

Rigaku Corporation

The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Not only is the Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.Supermini 200 Benchtop WDXRF Spectrometer Features: Analyze oxygen through uranium (O → U) Analyze: solids, liquids, powders, alloys and thin films Atmosphere: air, helium or vacuum X-ray tube: 50 kV, 200 W Pd-anode Primary beam filter: Zr is standard; Al optional Detectors: F-PC and scintillation Crystals: 3-position changer Autosampler: 12-position standard Vacuum: rotary pump standard Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A

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Rigaku Supermini200: Elemental Analysis by X-ray Florescence