TechTalk: Benefits of high-resolution ICP-OES for challenging applications

Friday, September 11 at 09:00 BST | 10:00 CEST | 04:00 EDT | 01:00 PDT

Complex sample matrices can make trace element analysis challenging, particularly when spectral interferences limit confidence in results. In applications such as mining analysis, conventional ICP-OES approaches may not always provide the resolution needed to clearly separate overlapping signals or achieve the detection limits required for demanding workflows.

In this 20-minute TechTalk, discover how high-resolution ICP-OES can help overcome spectral interferences, improve confidence in elemental analysis, and deliver reliable results for complex samples. The session will show how enhanced spectral resolution, combined with strong sensitivity, can support more robust trace element detection where conventional approaches may reach their limits.

Designed for ICP-OES users, elemental analysis specialists, analytical chemists, method developers, laboratory managers, QC/QA professionals, and researchers working with complex sample matrices, this session will provide practical insight into how high-resolution ICP-OES can strengthen analytical performance and support confident decision-making in challenging applications.

Certificate of attendance
If you attend the live TechTalk, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes. If you view the on-demand TechTalk, you can request a certificate of attendance by emailing editor@selectscience.net.

TechTalk details

• Cost: Free to attend
• Location: Online
• Duration: 20 minutes

Registration is required to secure your place. If you register but can’t attend live, you will receive a link to the on-demand recording once it becomes available.