Detection and Identification of Contaminations in the Manufacturing Process Using an IR Microscope

Spotlight 200 FTIR Microscope System is a high-performance microscopy platform, designed to generate high-quality, reproducible data from a variety of sample types. The combination of the highly-automated, very easy-to-use system and exceptional sensitivity ensures that quality spectra can be obtained from sample areas down to the accepted diffraction limit of 10 microns. In addition, the Spotlight 200 also has the capability to be fully upgraded to the Spotlight 400 Imaging System.Features & Benefits: Highest performance signal-to-noise system giving best quality spectra and fastest imaging Can operate in transmission, reflectance and micro-ATR for maximum sampling flexibility Can be used in extended range mid-IR, near-IR or dual range configurations to give maximum information from samples in the shortest possible time Rapid, high-performance instrument allows exceptional applications capability 10 μ spatial resolution Can be upgraded to a Spotlight 400 Imaging System allowing even faster imaging and the opportunity to add ATR Applications: Product defect analysis Impurity identification Component distribution studies Forensics Academic research