Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining.
The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family.
Thermo Scientific™ HeliScan™ brings a new era of microCT to Materials Science by leveraging advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity.
Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.
Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.
Component cleanliness analysis with a multi-purpose desktop SEM.
SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.
The Thermo Scientific™ Phenom™ Pharos is a desktop SEM with an FEG source that makes crisp, high-brightness images and the benefits of an FEG source accessible to everyone.
Desktop SEM for robust and effortless SEM analysis, expanding your research capability.
Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.
Economical desktop SEM with advanced, easy to use features.
Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization.
High throughput TEM and STEM microscope for all materials science applications.
High resolution TEM and STEM microscope for all materials science and semiconductor applications.
Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.
TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification.
TEM microscope for high resolution TEM and STEM characterization with accurate chemical quantification.
Atomic resolution TEM for materials structure analysis with an environmental mode for in situ TEM studies.
Precise SEM characterization of nanomaterials with sub-nanometer resolution and high material contrast.
3D SEM for large volume samples with serial block face imaging and multi energy deconvolution.
Leica's cryo-electron tomography workflow solution: boost your productivity with a seamless sample preparation workflow.
Cutting Edge in FIB sample preparation, imaging and analysis
Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact design. Its main body is only 55cm wide, and unlike conventional SEM design concepts the SU1510 does not require a special display and operating console - instead, monitor and PC controls can be conveniently placed on any user prepared workspac…
108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality coating of non-conducting samples for standard SEM imaging. The added functionality of the automatic features enable fine grain coating on a range of samples with a choice of target materials. The automatic purge and leak functions together with the o…
