Forensics Products & Reviews

Uv-Vis double beam scanning spectrophotometer with 1nm bandpass

UV-Vis double beam scanning spectrophotometer with GMP compliancy 

UV-Vis double beam scanning spectrophotometer with variable bandpass

Diagnostic human sample testing for the presence of SARS-CoV-2 through RT-qPCR methods.

Next-generation sequencing research services for SARS-CoV-2 variant surveillance.

The Thermo Scientific™ Apreo™ 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise.

Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining.

The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. 

Thermo Scientific™ HeliScan™ brings a new era of microCT to Materials Science by leveraging advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity. 

Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

Component cleanliness analysis with a multi-purpose desktop SEM.

SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.

An all-in-one digital inspection solution from Leica Microsystems. The Emspira 3 digital microscope empowers users to streamline inspection processes, cover inspection needs flexibly, and work in a confident and reliable way, with a single system.

The Thermo Scientific™ Phenom™ Pharos is a desktop SEM with an FEG source that makes crisp, high-brightness images and the benefits of an FEG source accessible to everyone.

Desktop SEM for robust and effortless SEM analysis, expanding your research capability.

Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.

Economical desktop SEM with advanced, easy to use features.

Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization.

High throughput TEM and STEM microscope for all materials science applications.

High resolution TEM and STEM microscope for all materials science and semiconductor applications.

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification.

TEM microscope for high resolution TEM and STEM characterization with accurate chemical quantification.

Atomic resolution TEM for materials structure analysis with an environmental mode for in situ TEM studies.