ZEISS Atlas 5

Characterizing composite materials is a challenging task. Understanding the nucleation processes is critical toward engineering against failure, but traditional bulk testing methods are insufficient to describe this process. ZEISS presents how correlative microscopy is a viable conduit into the digital material testing approach. A carbon fiber reinforced composite hockey stick was used as the subject of the characterization study, though this same technique can apply to any variety of materials, from glass composites to metal matrix composites, as well as to monolithic materials. Correlative microscopy enabled a robust imaging-to-simulation workflow, producing a model that is available for further digital modification and analysis. Through implementation of this procedure in a regular basis, material development efficiencies may be enhanced, leading to high-performance products in a reduced amount of time.

Microstructural changes after cycling of a solid oxide electrolysis cell (SOEC) were studied by means of FIB-SEM tomography. The advanced tomography package ZEISS Atlas 5 3D Tomography allows high resolution 3D electron imaging and 3D EDS elemental imaging using two different sets of SEM conditions optimized for the respective task. The additional chemical information facilitated the correct segmentation of the different phases present in the sample. This was crucial to better understand the diverse mechanisms leading to deterioration of the cell.

This application note describes the automated acquisition of multi-image mosaics at multiple sample sites for electron microscopy, detailing the various sample collection capabilities.

This white paper investigates the microstructural changes after cycling of a solid oxide electrolysis cell (SOEC), studied by means of focused ion beam (FIB)-SEM tomography. The advanced tomography package, ZEISS Atlas 5 3D Tomography, enables high-resolution 3D electron imaging and 3D energy dispersive X-ray spectroscopy (EDS) elemental imaging, using two different sets of SEM conditions optimized for the respective task.

This application note describes the results of a multi-scale correlative tomography study on the corrosion of a Magnesium alloy. Zeiss’ Atlas 5 is used to efficiently link and navigate between in situ sub-micron X-ray microscopy, nanoscale X-ray microscopy and FIB-SEM tomography. The study provides a description of the complex crack and corrosion byproduct geometries which can lead to a more complete understanding of the underlying mechanisms for corrosion.

This application note describes how to use the ZEISS Atlas 5 Array Tomography to image serial sections fast and efficiently at nano scale resolution. Atlas 5 Array Tomography has been specifically designed for automated imaging of serial sections to enable 3D visualizations of large volumes.

Peter Lander discusses the legacy and development of ZEISS microscopy and the importance of conferences such as M&M. Its collaboration with scientists has enabled ZEISS to provide instrumentation that satisfies their needs, with the aim to develop simplified software that enables complementary and overlaying analyses over a range of its instrumentation.

This video demonstrates the many applications of the ZEISS Atlas 5, allowing you to master your multi-scale challenges.

Reduce your time to result with automated nano-imaging of large samples: image your serial sections fast and efficiently. Atlas 5 Array Tomography is your unique, easy-to-use hardware and software package for your electron microscope (EM).

This video presents an integrated solution for your 3D electron microscopy workflow, from sample preparation to the final images. Discover the new ZEISS MultiSEM 505, the world’s fastest electron scanning microscope, and automated solutions for serial sectioning and imaging. Learn how these technologies will help to advance the field of neuroscience.

Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography, and greater integration in data reporting

Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography and greater integration in data reporting

Upgrade opens new opportunities in materials science and covers advances in analytics, tomography, sample preparation, and data integrity

Promise of enhanced analytics, tomography, sample preparation and data integrity

Find out how Swansea University is developing correlative imaging workflows for multiple applications

Find out how X-ray and focused ion beam microscopy are helping researchers to characterize the structure of materials

Enhanced resolution and faster FIB material processing for maximum efficiency

SelectScience® spoke to Thomas Deerinck, National Center for Microscopy and Imaging Research at University of California, San Diego, about how correlative microscopy is helping scientists understand disease states