This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory.
Available Options with the K-TEK NSG30 AFM Non-Contact Probe:
-PtIr, TiN, and Au tip coatings
-CoCr magnetic tip coating*
*Quantity & cantilever restrictions apply.