Revolutionary ultra-low-energy, concentrated ion beam
Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Targeted, ultra-low-energy NanoMillingsm process
The NanoMill® system features gaseous ion source technology that results in ion energies as low as 50eV and a beam size as small as 2 microns. It allows specimens to be prepared without amorphization, implantation, or re-deposition. The ion beam can be targeted to a specific area of interest. A secondary electron detector (SED) is used to image the ion-induced secondary electrons that are generated from the targeted area of the specimen.
The NanoMill® system is easily programmable. Adjustable ion beam energies, milling angles, specimen rotation, and cryogenic specimen cooling parameters afford maximum flexibility to ensure the optimal preparation of a wide variety of specimens. A vacuum load lock facilitates rapid specimen exchange for high-throughput applications.