JEM-ARM300F2 GRAND ARM™2 by JEOL USA

Manufacturer JEOL USA
Atomic Resolution TEM


JEM-ARM300F2 GRAND ARM™2 by JEOL USA product image
JEM-ARM300F2 GRAND ARM™2
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The preferred choice for all aberration-corrected electron microscopy needs. Standard features include a cold field emission gun, a hybrid HAADF detector for increased S/N throughout the entire 40-300 kV operating range, and enhanced light element contrast via e-ABF imaging. Combining dual, large-area SDDs for high speed EDS with redesigned pole pieces enables atomic-resolution spectroscopy without sacrificing spatial resolution. The Grand ARM2 is the ultimate analytical S/TEM instrument with unparalleled flexibility.

  • No compromise in spatial resolution - new pole piece design yields increased EDS solid angle without sacrificing resolution
  • Mitigation of environmental effects - enclosure reduces impact of air flow, temperature changes, and acoustic noise
  • Ultimate functionality with automated HT settings, corrector alignments, and optimized lens routines promote ease-of-use