CrossLab Preventive Maintenance by Agilent Technologies

Agilent CrossLab Preventive Maintenance ensures that your instruments deliver peak performance while minimizing unplanned downtime.


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Agilent CrossLab Preventive Maintenance
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Agilent CrossLab Preventive Maintenance ensures that your instruments deliver peak performance while minimizing unplanned downtime. Our factory-recommended service ensures reliable operation and accuracy for a wide range of analytical systems, delivered by certified service engineers. All field personnel use high quality Agilent parts and supplies, and follow certified procedures for the highest levels of maintenance. 

CrossLab Enhanced Preventive Maintenance provides an additional level of service for instruments experiencing high use and/or harsh operating conditions. Expert Ion Source Cleaning services are also available to further minimize downtime and help assure the highest sensitivity from your mass spectrometer.

Features:

  • Factory-recommended service ensures reliable operation and accuracy for a wide range of analytical systems, reducing the incidence of instrument repairs by as much as 24%, and saving an average of two days per year of downtime, based on a five-year study.
  • Reduced downtime and proactive repairs save an average of 31% per year, based on the five-year study.
  • All field personnel use high quality Agilent parts and supplies, and follow certified procedures for the highest levels of maintenance.
  • Service includes all travel, labor, and supplies required, and follows proven procedures for the expert inspection, cleaning, calibration, and lubrication of your analytical system.
  • High-wear parts are proactively replaced according to defined maintenance procedures, regardless of condition.
  • Enhanced PM service includes replacement of most sample pathway components in gas chromatographs (GCs) or GCMSs GC and GC/MS systems equipped with headspace samplers.
  • Enhanced services includes proactive replacement of most solvent pathway components, regardless of condition, and detector components (including deuterium lamps) in LCs and the LC portion of LC/MS systems.