ZEISS Axio Observer for Materials
Your Inverted Microscope System for Metallography.
Receive your quote directly from the manufacturer.
Fast, flexible, economic: Take advantage of Axio Observer’s inverted construction to investigate a large number of samples in no time at all – or to explore heavy ones, just as efficiently.
There’s no need to refocus, even when changing magnification or switching samples. Axio Observer combines the proven quality of ZEISS optics with automated components to give you reliable, reproducible results.
Using dedicated software modules you can analyze, for example, non-metallic inclusions, grain sizes and phases – it’s fully automatic. Axio Observer is your open imaging platform: invest in only the features you need today.
As requirements change, a simple upgrade keeps your system ready for all materials applications.
Microstructural Investigation of Austempered Ductile Iron (ADI) with "Shuttle & Find"
Austempered ductile iron (ADI) excels through strength, wear resistance and toughness – characteristics that make ADI the material of choice for use in combustion engines and gear box components. This means that safety aspects are also involved in addition to purely functional aspects. For this reason, changes in the ADI production process need to be monitored with respect to the material's characteristics and must be optimized systematically. For the micro- and nanoscopic analysis of the structure and precipitations, scientists typically use both light and electron microscopes. To date, however, there has been no possibility of relocating regions of interest without doubt when transferring the sample from the light to the electron microscope or vice versa. "Shuttle&Find" – the interface for correlative microscopy in materials analysis — offers an easy-to-use solution, enabling seamless integration of these two complementary technologies for the first time.
Microscopic Methods in Metallography Using ZEISS Axio Observer
Knowledge of the structure, crystal structure, and micromorphology, as well as elemental composition and distribution are essential for ensuring safety in designs and components of all sizes – ranging from fields of mechanical engineering and aeronautical engineering to power station engineering and electrical engineering. The observed structures, which are responsible for the properties of the materials to a significant extent, are becoming increasingly smaller and therefore more difficult to differentiate. This application note demonstrates the high resolution analysis of metal samples using the ZEISS Axio Observer.
The Use of Microscopy in Computer Science: ZEISS Microscopy
Sina Shahbazmohamadi, Director of CHASE Lab in the University of Connecticut, researches hardware security in electronics, including failure analysis. In this video, Shahbazmohamadi describes how his lab uses unique ZEISS microscopes to gain authentic models and images to probe the authenticity and integrity of electronic parts.
ZEISS Legacy Continues: Advancing Microscopy at M&M 2017
Peter Lander discusses the legacy and development of ZEISS microscopy and the importance of conferences such as M&M. Its collaboration with scientists has enabled ZEISS to provide instrumentation that satisfies their needs, with the aim to develop simplified software that enables complementary and overlaying analyses over a range of its instrumentation.
ZEISS Presents a Wide Range of Microscopes at PITTCON 2017
Visit Booth #1852 to see ZEISS Microscopy products for use in life science research and material analysis
