WITec GmbH New Hardware and Software Developments Which Improve User Experience
Visit WiTec at Booth #1638 at Pittcon 2017
6 Mar 2017
The Pittcon Conference and Expo in Chicago will see the introduction of results-oriented hardware and software advancements that combine to extend WITec’s lead in Raman imaging and SPM innovation.
WITec will present new developments that focus on delivering meaningful, useful results to researchers in a wide variety of fields;
- WITec Suite FIVE provides intuitive and sophisticated control of measurements, guided by new software wizards, from initial setup through data post-processing and correlation. Also included with Suite FIVE is WITec’s novel TrueComponent Analysis. This data-processing function expedites the identification and location of chemical components in a sample.
- A new automated objective turret enables magnification selection with a mouse click and stored offset correction.
- The WITec EasyLink handheld controller gives the user an immediate, tactile interface with the instrument.
- WITec’s TrueSurface Microscopy, the groundbreaking innovation that originated topographic Raman imaging, has been comprehensively updated with one-pass operation and closed-loop active monitoring.
Display your data acquisition skills and win
See all the new WITec developments at booth #1638 at the Pittcon 2017 Conference & Expo in McCormick Place in Chicago, Illinois from March 5th to the 9th. Join us to compete in a memory challenge. Participants will attempt to match images of samples and measurements on a screen. The participant with the fastest completed set for each day will be awarded an EasyLink handheld controller (Xbox-compatible) and an Xbox One will be given away in a later drawing.
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TrueSurface Microscopy
Oxford Instruments RamanTrue Surface Microscopy - Confocal Microscopy Along with Large Area Optical Profiling WITec´s new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image. True Surface Microscopy follows the surface topography with high precision, so that even rough or inclined samples always stay in focus. To achieve this unique capability, the WITec alpha500 series can be equipped with a highly precise sensor for optical profilometry. The topographic coordinates from the profilometer measurement are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing chemical properties at the surface of the sample, even if this surface is rough or inclined. True Surface Microscopy Features: Extension for the WITec alpha500 series that combines Large-area surface topography profiling with confocal Raman imaging: Topographic confocal Raman imaging Topographic large-area Surface imaging Topographic spectroscopic imaging Unique combination (patent pending) delivers innovative application possibilities for new research techniques Ease-of-use through full integration with the alphaControl hardware and WITec Project software environment Scan speed up to 2000 pixels/s for rapid data acquisition Spatial resolution of 10 - 25 μm laterally and Light source: High intensity LED for highest throughput, accuracy and longevity Measuring distance: 10 mm – 16 mm providing wide-ranging sample size flexibility Multi-sensors easily configurable to meet virtually any application