Rigaku presents latest XRM and CT analytical instrumentation at 2019 Microscopy & Microanalysis meeting

Rigaku is showcasing its newest X-ray analytical technology at M&M 2019

7 Aug 2019
Holly McHugh
Administrator / Office Personnel

Rigaku Corporation, a global leader in X-ray analytical technology, is pleased to announce its attendance at the Microscopy & Microanalysis 2019 Meeting (M&M 2019), taking place August 4 - 8, 2019 in Portland, Oregon at the Oregon Convention Center.

The Microscopy & Microanalysis Meeting, organized by the Microscopy Society of America, is the world’s largest scientific gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors. The conference covers topics such as the latest techniques, methodologies and findings, spanning nano-to-macroscopic scales, and advances in fields such as nanotechnology, biological and clinical sciences, materials science, 3D manufacturing, and metallurgy.

X-ray microscopy (XRM) and computed tomography (CT) equipment from Rigaku enable nondestructive analysis of large samples at high resolution. Rigaku is spotlighting its current XRM and CT solutions at booth 437.

X-ray microscopy is suited to a range of materials, from low-density substances such as biological samples to high-density materials such as ceramics and steels. The Rigaku nano3DX X-ray microscope images an entire sample from multiple angles, using a high-powered rotating anode X-ray source and a high-resolution CCD imager, enabling reconstruction of a 3D image at 0.27 µm resolution. The computer model allows the user to view sections at any point on any plane, providing valuable insights into the structure of the sample.

Another distinct feature is its ultra-wide field of view. The nano3DX is able to measure volumes up to 25 times larger in a single scan compared to other systems at similar resolutions in comparable time frames.

Applications for the nano3DX range from materials science to electronics and semiconductors to mining and minerals exploration, as well as life sciences and pharmaceuticals.

Also available are the Rigaku CT Lab GX industrial 3D X-ray micro CT imager and the Rigaku CT Lab HX benchtop X-ray micro CT system. Computed tomography reveals, at highspeed, the high-resolution, three-dimensional structure of an object by means of computer-processed combinations of numerous X-ray images taken from different angles. The CT Lab GX series offers the latest 3D CT technology enabling measurement of industrial products in a short period of time.

For 3D and 4D imaging of micro-scale morphologies, Rigaku offers the Rigaku CT Lab HX highperformance benchtop X-ray micro CT system, a compact yet powerful micro CT system that can provide three-dimensional X-ray images of a wide variety of samples. The CT Lab HX system features the largest field of view (FOV) and most powerful X-ray source in its class (130 kV, 39W).

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nano3DX XRM

Rigaku Corporation

Rigaku nano3DX is a true X-ray microscope (XRM) with the ability to measure relatively large samples at high resolution. This is accomplished by using a high powered rotating anode X-ray source and a high-resolution CCD imager. The rotating anode provides for fast data acquisition and the ability to switch anode materials easily to optimize the data acquisition. AVAILABILITY: Japan, Austraila/NZ and North AmericaThe new nano3DX allows you see into many types of samples, including those that have low absorption contrast, for example CFRP, or denser materials like ceramic composites. The nano3DX allows you to achieve this by providing the ability to change the X-ray wavelength to enhance contrast or penetration.In the nano3DX, the magnification takes place in the detector using true microscope elements. This design places the sample close to a high-resolution detector, allowing for a near-parallel beam experiment. This means greater instrument stability and shorter data collection times providing the highest resolution of any X-ray microscope in its class.The nano3DX design is a vast improvement over older implementations that use a small source and a long sample-to-detector distance. This geometric magnification requires a very small source and extreme stability to prevent smearing. Data acquisition times can be quite long because small sources are also low power.nano3DX XRM Features: Ultra-wide field of view, 25X larger volume than comparable systems 3 X-ray wavelengths (Cr, Cu and Mo Ka) to optimize imaging for different sample matrices Parallel beam geometry for high contrast and rapid data collection Auto 5-axis (XYZ and rotation) stage and on-axis imaging system High resolution three dimensional (3D) images High power rotating anode X-ray source High contrast for low-Z materials High-resolution CCD imager

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