Oxford Instruments Asylum Research is pleased to announce the release of fast force mapping (FFM) mode for the Jupiter XR atomic force microscope (AFM). The FFM mode enables users to image sample topography and simultaneously acquire nanomechanical information such as elasticity, adhesion, and hardness. Additionally, when used in conjunction with the conductive AFM probe holder, sample conductivity can also be characterized.
“The addition of FFM on our large sample Jupiter AFM, together with our AM-FM nanomechanics capability provides customers with the ability to characterize a wider range of samples which otherwise might be difficult with a single, force curve-based, nanomechanics methodology,” commented Dr. Jason Li, Applications Scientist Manager at Oxford Instruments Asylum Research.
Asylum Research AFMs are widely used across many different industrial and academic research fields including energy storage, polymers, semiconductors and 2D materials. The Jupiter XR is the lowest noise, large-sample AFM that can accommodate samples up to 200 millimeters in diameter and inspect areas up to 100×100 microns while still delivering ultra-high resolution and high throughput, with typical images requiring <1 minute to acquire.
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