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Product News

Nikon Expands Advanced Imaging Solutions to Include SEM

3 Dec 2008

Product News

MDS Analytical Technologies Introduces Expanded Application Potential for Arcturus® Laser Capture Microdissection Systems

12 Nov 2008

Product News

Olympus introduces the new dotSlide 2.0 virtual microscopy system

31 Oct 2008

Product News

Bruker AXS Microanalysis Introduces Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash<sup>®</sup> Silicon Drift Detectors and New Particle Analysis Software

3 Aug 2008

Product News

Agar Scientific Exhibiting Range of 4000 Items at Stand J4 at MICROSCIENCE 2008

1 Jun 2008

Product News

Hitachi Announces New Analytical Variable Pressure FESEM

1 Jun 2008

Product News

See the NEW FEI Phenom Imaging System at MicroScience 2008, Stand A1

22 Apr 2008

Product News

Hitachi Electron Microscopy Range Expands

22 Apr 2008

Product News

LOT appointed UK & Ireland agents for the FEI Phenom Imaging System

12 Mar 2008

Product News

Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM

4 Mar 2008

Product News

Tabletop Microscope Kinder To The Environment

3 Mar 2008

Product News

Fisher Scientific Releases 2008-09 Catalog

3 Mar 2008

Product News

Chemical Analysis Announced For Tabletop Microscope

9 Nov 2007

Product News

FEI Unveils Titan<sup>3</sup> 80-300 S/TEM

16 Oct 2007

Product News

Thermo Fisher Scientific Announces an Agreement to Distribute Edax’s EBSD Systems

16 Sept 2007

Product News

0.5 Angstrom Imaging Milestone Reveals the Smallest Details Ever Seen by Electron Microscopy

5 Sept 2007

Product News

Bruker AXS Announces Microanalysis Webinar: Practical Spectrum Imaging—Rapid Collection for Routine Analysis

30 Aug 2007

Product News

CLUE: Spectroscopic Accessory for SEMs

15 Aug 2007

Product News

Thermo Fisher Scientific Unveils New Silicon Drift Detectors with Low Energy Detection Capabilities Down to Beryllium

6 Aug 2007

Product News

FEI Introduces Nova NanoSEM™ 30 Series

5 Aug 2007

Product News

Agar announces the availability of the Fischione Instruments Range of Advanced Tomography Holders for TEM

22 Jul 2007

Product News

New Product Announcements at EMAG

12 Jul 2007

Product News

Hitachi Announces 3D Analysis Software for VPSEMs

20 Jun 2007

Product News

Use An SEM For The Day!

22 May 2007

Product News

New Catalog from Electron Microscopy Sciences

15 May 2007