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Sensitive compositional analysis at the micro- and nanoscale, a secondary ion mass spectroscopy workshop

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Watch this webinar to gain insight into SIMS technology and discover an innovative solution offering the current world record in SIMS lateral resolution

16 Apr 2020
Cameron Smith-Craig
Cameron Smith-Craig
Pharma and Applied Sciences Editor
Zeiss

When it comes to elemental analysis of low concentrations or light elements, secondary ion mass spectroscopy (SIMS) is the technique of choice for materials characterization. SIMS not only allows the detection of element traces down to the parts per million (ppm) level, it also enables the detection of all elements of the periodic table, isotopes, and small ion clusters.

In this popular workshop, gain insight into SIMS and discover the new ZEISS SIMS portfolio, including cost-efficient add-ons for ZEISS FIB-SEMs as well as an innovative solution offering the current world record in SIMS lateral resolution. Selected applications in steel failure, battery, and solar cell research illustrate the use of the different ZEISS SIMS solutions.

Register Now

Join this webinar to learn about:

  • The basics of SIMS, including a brief overview of different mass selection principles
  • How a cost-efficient SIMS add-on performs on a standard FIB-SEM instrument
  • How to achieve the highest spatial resolution with SIMS using the neon ion beam of a helium ion microscope (HIM)

Attend the live webinar on Tuesday, May 5, at:
16:00 BST | 11:00 EDT | 08:00 PDT | 17:00 CEST

Who should attend?
Microscopists interested in analytical techniques complementary to EDS.

All webinar participants can request a certificate of attendance and a learning outcomes summary document for continuing education purposes.

Find out more on this topic by registering to watch the full webinar>>

SelectScience runs 3-4 webinars a month across various scientific topics, discover more of our upcoming webinars>>

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Mass SpectrometryMass spectrometry (MS) is a powerful analytical technique used to identify and quantify molecules based on the mass-to-charge ratio of gas-phase ions. It provides detailed information about the structure, composition, and properties of compounds and is widely used across fields such as environmental monitoring, materials science, drug discovery and development, food and beverage testing, and wider chemical research. Key MS techniques include tandem mass spectrometry (MS/MS), liquid chromatography–mass spectrometry (LS-MS) and inductively coupled plasma (ICP-MS). Choosing from these wide range of techniques and technologies can be a daunting task, so keep up to date with scientific applications, performance expectations, and customer reviews here all in one place. Visit our product directory to receive quotes direct from the manufacturer. Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.BatteriesAlloy SteelSolar Energy

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