Rigaku Presents the MiniFlex Benchtop X-ray Diffraction Instrument at the 2016 MRS Fall Meeting
28 Nov 2016
Product news
Rigaku Corporation is presenting its diverse lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman spectroscopy instrumentation at the 2016 MRS Fall Meeting and Exhibit, Sunday November 27 to Friday, to December 2, 2016.
The event is organized by the Materials Research Society and will be held at the John B. Hynes Veterans Memorial Convention Center in Boston, Massachusetts. Rigaku, a global leader in X-ray analytical instrumentation, will be exhibiting at the event at booth #712.
The conference is a leading event for those in the field of materials research, gathering a diverse global audience of chemists, physicists, materials scientists, biologists, engineers and others. It is attended by as many as 6,000 researchers from around the world, will showcase a wide range of product and service categories and feature over 50 symposia.
Materials analysis instrumentation from Rigaku range from benchtop devices, suited for researchers employing X-ray techniques, to high-end instruments with advanced analytical capabilities. Among the instruments featured at the event will be the fifth generation Rigaku MiniFlex benchtop X-ray diffraction instrument. The MiniFlex is a general-purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials
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MiniFlex Benchtop XRD
Rigaku CorporationNew 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case