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Ceram to Host ‘Surface Analysis Workshop’ on 22 October 2013

28 Aug 2013
Sarah Thomas
Associate Editor

Product news

Ceram, the international materials technology company, will be holding a ‘Surface Analysis Workshop’ on Tuesday 22 October at its headquarters in Stoke-on-Trent.

As experts in surface, near surface and interface analysis, with state-of-the-art equipment and a wide range of techniques, Ceram will provide an introduction to various surface analysis techniques.

The Workshop will be split into a morning of presentations around the main techniques and industry applications, and an afternoon of laboratory demonstrations.

Presentation topics will include: Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy (XPS), Chemical Imaging by Secondary Ion Mass Spectrometry (ToFSIMS), Chemical Characterization of Layer Structure and Buried Interfaces by Dynamic Secondary Ion Mass Spectrometry (DSIMS), and Quantification of Surface Topography and Layer Thickness Measurement.

Delegates will have the opportunity to take a sample along for the technique demonstrations and/or for a one-to-one discussion with a member of Ceram’s surface science team.

The workshop will run from 9:30am - 5:00pm and has a registration fee of £150.00 + VAT (this will include refreshments and a buffet lunch).

For programme/further information and to register, click on the 'company website' link below.

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Mass SpectrometryMass spectrometry (MS) is a powerful analytical technique used to identify and quantify molecules based on the mass-to-charge ratio of gas-phase ions. It provides detailed information about the structure, composition, and properties of compounds and is widely used across fields such as environmental monitoring, materials science, drug discovery and development, food and beverage testing, and wider chemical research. Key MS techniques include tandem mass spectrometry (MS/MS), liquid chromatography–mass spectrometry (LS-MS) and inductively coupled plasma (ICP-MS). Choosing from these wide range of techniques and technologies can be a daunting task, so keep up to date with scientific applications, performance expectations, and customer reviews here all in one place. Visit our product directory to receive quotes direct from the manufacturer. X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Surface Analysis

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Ceram to Host ‘Surface Analysis Workshop’ on 22 October 2013