Application Note: ZEISS Xradia Ultra: Sample Preparation for Nanoscale 3D X-ray Microscopy
19 August 2016
X-ray microscopy (XRM) enables 3D investigation of internal structure across a wide range of materials and length scales. The non-destructive nature of X-ray imaging uniquely enables in situ and 4D imaging, where the same sample is imaged multiple times under varying conditions to observe microstructural evolution. ZEISS Xradia Ultra is offers non-destructive 3D imaging, bridging the gap between traditional micro CT or submicron resolution XRM. This application note introduces various sample preparation methods and tools that are available or can be adapted for use with Xradia Ultra.