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Imaging Polymers with a Helium Beam

ZEISS Research Microscopy Solutions
28 Jun 2018

In this application note, find out the advantages to using the ZEISS ORION NanoFab helium beam technology over conventional electron microscopy, and how it could allow researchers new insights into their materials.

Links

ZEISS Research Microscopy SolutionsCompany website

Tags

Non-Destructive TechniquesElectron MicroscopyPolymersMicroscopy

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