Application Note: Digital Pulsed Force Mode – Polymer Differentiation
26 April 2013

The Digital Pulsed Force Mode (DPFM) provides new perspectives for materials research on the nanometer scale. Its ability to store the full tip-sample interaction during an AFM imaging process allows the user to record, along with the topography, mechanical and energetic properties. In this application note, material properties on the nanometer scale of two rubber compounds are presented.