Application Note: Data Collection and Processing for Single Crystal X-ray Analysis
8 January 2016

Data collection and processing have a significant impact on the structure analysis step. Considering the power of current direct method programs, quality data is nearly equal in importance to obtaining the initial structure, when crystallographic difficulties such as an ambiguous space group and twining are not involved. This application note discusses problems and measures in obtaining diffraction data using two-dimensional detectors: a CCD and an IP detector.