Application Note: Stabilizing the piezoresponse of rough ferroelectric materials
31 July 2020

In this white paper, Park Systems demonstrates dual-frequency resonance-tracking piezoresponse force microscopy (DFRT PFM) capabilities on the ferroelectric material bismuth ferrite (BFO) using a Park Systems NX20 AFM coupled with a Zurich Instruments HF2 lock-in amplifier (LIA).