Application Note: Rapid sample preparation for EBSD-analysis: Enabled by the LaserFIB
25 February 2021

State-of-the-art preparation methods are mechanical polishing with a vibration-polish finish for large areas or focused ion beam (FIB) polishing for smaller areas and sensitive materials.

In this application note, ZEISS demonstrate how to overcome the limitations of these methods by utilizing the new femtosecond laser for ZEISS Crossbeam, to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.