ResourceLife Sciences
Rapid sample preparation for EBSD-analysis: Enabled by the LaserFIB
25 Feb 2021State-of-the-art preparation methods are mechanical polishing with a vibration-polish finish for large areas or focused ion beam (FIB) polishing for smaller areas and sensitive materials.
In this application note, ZEISS demonstrate how to overcome the limitations of these methods by utilizing the new femtosecond laser for ZEISS Crossbeam, to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.
Links
Tags
Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Sample PreparationSample preparation can improve the quality and speed of separation techniques. Products to assist sample preparation include filtration equipment, evaporators, membranes and sieves.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
