AFM / STM Accessories
Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single mode fiber and a sensing element. The compact design (6 mm long, 3 mm diameter) and the attocube-typical compatibility with extreme environments such as ultra high vacuum und very low temperature open up new possibilities and applications for int…
Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with innovative software architecture, offering superior performance and unprecedented variety of control concepts. The Attocube ASC500 SPM controller was developed with the goal to never be the limiting factor in any SPM experiment. All desirable functions…
Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be delivered compatible with low temperatures, ultra high vacuum and magnetic fields. Key Features of the Attocube Systems ANPx101/RES: environments LT; UHV; magnetic field closed loop resolution: ~ 200 nm motion linear stepping & scanning travel…
Attocube Systems ANPx101/NUM PositionerThe ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can be delivered compatible with ultra high vacuum. Key Features of the Attocube Systems ANPx101/NUM Environments UHV Closed loop resolution: 10 nm Motion linear stepping & scanning Travel 5 mm Resolution sub nm Size 24 x 28 x 14.5 mm Load 100 g Encod…
K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity measurements. Each grating offers a different step height. Now the calibration grating set TGS1 which consists of three gratings TGZ1, TGZ2, TGZ3 is available with PTB tracable certificate. Ordering grating set TGS1 with code TGS1_PTB you will get…
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of angular distortion - 3-D visualization of the scanning tip - Determination of tip sharpness parameters (aspect ratio and curvature rad…
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions - Submicron SPM calibration in X or Y direction - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of…
K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica. Molecules are uniformly distributed over the surface with the molecular density - 0,5-7 molec./um2. The typical DNA length is 1009 nm. Recommended humidity for obtaining a good image is 3-5%. K-TEK Nano DNA Sample is perfect for: - Beginners lear…
STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex control of AFM set up: • Height calibrating in angstrom and single nanometer intervals on the monoatomic steps; • Using the as the substrate for investigations of bio-objects, particulate matter and ot…
K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used. Available HO…
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used.
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degreesHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
