Materials Products & Reviews

With the addition of the highly flexible and versatile 3100 Mass Detector, Hitachi’s LaChrom Elite ® HPLC System further solidifies its position as the leader in chromatographic analysis for a wide range of applications. The LaChrom Elite® HPLC system, in combination with the Waters® 3100 Mass Detector, provides unmatched selectivity, sensitivity and throughput for improved laboratory productivity. Features Seamless inte…

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM. Imaging is completely digital – you won’t find a viewing or projector chamber - and Hitachi’s EMIP-SP database software automatically catalogues your single frame and montaged images. The turbopump evacu…

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with consideration of the total system performance. This results in exceptional stability, milling performance and resolution, allowing e.g. automated mill-and-monitor operations for 3D reconstructions with slicing steps down to 5nm. NB5000 incorporate…

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are Two Models ZoneSEM ZoneSEM's sample holder stage was designed for Hitachi Type I and Type II carriers. Adjustable height and optional holders available. Provides effective cleaning of surfa…

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

Inductively Coupled Plasma Mass Spectrometer (ICP-MS) The Science of sensitivity Bruker's ICP-MS is famous for its innovative and unique technology and has now been further refined to meet the ever increasing demands of latest application and laboratory requirements. Bruker's aurora M90 continues to be the workhorse for the routine laboratory, now with additional and improved characteristics. In addition to the aurora M90, Bru…

High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…

Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…

Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…

High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…

Disposable cuvettes for spectrophotometry, optical PS visible range cuvettes, UV Grade PMMA cuvettes. Standard and semi-micro disposable cuvettes for spectroscopy made of optical PS and PMMA UV grade optical windows to achieve optimal transmittance through spectral range from 340 to 800 nm (OPS) an from 280 to 800 nm (PMMA UV qrade). The engineering and quality control determine the reproducibility of the cuvettes. These are s…

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The i…

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline structures which affect physical properties in a wide range of materials. As an integral part of the Thermo Scientific NORAN System 7, simultaneous acquisition of EBSD and EDS/WDS spectral images are performed with ease.

Dynamic light scattering based on the unique PCCS-technique for size and stability analysis of opaque nano-suspensions and emulsions from 0.5 nm to 10,000 nm

Ultrasonic extinction sensor for particle size and concentration analysis in highly concentrated suspensions and emulsions for process or laboratory applications from below 0.1 µm to 3,000 µm

Laser diffraction sensor for process particle size and distribution analysis of fine, even cohesive powders from 0.25 μm to 3,500 μm

MicroXCT-200 - High Resolution and Contrast; Large Sample Size and Shape Flexibility; Automated Multiple Point Imaging. The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples. Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials. The MicroXCT-200 provides t…

UltraXRM-L200 - Synchrotron-like 3D Imaging in a Laboratory System. The UltraXRM-L200 is the only lab based ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes. Xradia's precision X-ray focusing optics deliver a resolution as fine as 50 nm, seamlessly extending the capabilities of X-ray CT beyond those of conventional scanners. Integrated Zernike phase contrast imaging enhances the visibility o…

Bruker’s innovative PIONA+™ Analyzer, based on the powerful 450-GC gas chromatograph, provides a highly flexible platform to obtain comprehensive characterization and quantitative information, including hydrocarbon group types, aromatics and oxygenates per carbon number for spark emission fuels. The system comes complete with ultra high performance columns and traps, CompassCDS™ chromatography data handling software and PIONA+…

The Horizontal Optical Dilatometer Misura® ODLT is the ideal instrument to study the coefficient of thermal expansion (CTE), testing materials beyond the softening point and reproducing industrial firing cycles. It allows to carry out thermo-mechanical measurements even beyond the softening point of a material throughout the entire industrial firing cycles (up to 1750°C on sample). Also, it can determine an expansion and shrin…

The Vertical Optical Dilatometer Misura® ODHT is the ideal instrument to study sintering, sintering kinetics, expansion and shrinkage. It allows to carry out thermo mechanical measurements following the process of expansion, sintering or bloating of materials. The practical applications of this technique are various and include all fields in which it is important to know the thermo-mechanical behaviour of the materials, reprod…

The Heating Microscope is able to acquire and store images of a specimen subjected to an industrial heating cycle ,while all the dimensional parameters (height, length, area…,etc.) are measured automatically during the test in order to identify: flattening/melting behaviour, fusibility, identification of the characteristic temperatures Misura® Heating Microscopes have been continuously developed and implemented to gain technic…