Eclipse FN1 by Nikon Instruments

Manufacturer Nikon Instruments  |  Available Worldwide
The Eclipse FN1 fixed stage microscope has been developed especially for electrophysiological research to facilitate patch-clamp experiments. The FN1 offers a slim body, streamlined structure, improved electrode placement, long working distance and greater noise reduction. A deeper area of the specimen can be observed clearly with infrared light. Features: One lens covers from low to high magnifications The high NA, long working distance 16x objective allows observation at broad ma... Read more


Eclipse FN1 by Nikon Instruments product image
Eclipse FN1
Request Pricing

Receive your quote directly from the manufacturer.



0 Scientists have reviewed this product


Write the First Review

No Reviews

The Eclipse FN1 fixed stage microscope has been developed especially for electrophysiological research to facilitate patch-clamp experiments. The FN1 offers a slim body, streamlined structure, improved electrode placement, long working distance and greater noise reduction. A deeper area of the specimen can be observed clearly with infrared light.

Features:

  • One lens covers from low to high magnifications

The high NA, long working distance 16x objective allows observation at broad magnification range from 5.6x to 64x when combined with an optional variable magnification double port. 

  • Image deeper areas with ultimate clarity with IR-DIC

The CFI Apochromat NIR 40X/60X W enables clear observation of the minute structure of thick specimens. The CFI Plan 100XC W is ideal for IR-DIC imaging, confocal applications and multiphoton imaging. 

  • Easy electrode placement

Easy access of microelectrodes to the specimen – the objectives have a long W.D. of 2.5-3.5 mm and broad approach angle up to 45°.

  • Safe, easy objective changeover

Objectives mounted on the sliding nosepiece can be raised when switching magnifications preventing the objective from colliding with the manipulator or the chamber. 

  • Easy operation

The focus knob and field diaphragm ring are located on the front part of the microscope base. There are no cumbersome outside belts allowing easy operation using a fixed stage. 

  • Enhanced noise reduction

Electrical noise and vibration noise have been successfully reduced. 

  • Responsive to a broad range of experimental needs

The microscope height can be raised 10-30 mm, facilitating large specimen observation. In addition, the condenser, sub-stage and turret can be removed completely to allow for more free space.