Rigaku presents latest X-ray analytical solutions at 2019 MRS Fall Meeting
Rigaku is showcasing its XRD, XRF and Raman instrumentation at the 2019 Materials Research Society Fall Meeting & Exhibit in Boston
3 Dec 2019
Rigaku Corporation is presenting its diverse lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman spectroscopy instrumentation at the 2019 MRS Fall Meeting and Exhibit, Sunday December 1 to Friday, December 6, 2019. The event is organized by the Materials Research Society and will be held at the Hynes Convention Center and adjacent Sheraton Boston Hotel in Boston, Massachusetts. Rigaku, a global leader in X-ray analytical instrumentation and a “Gold” level corporate partner of the Materials Research Society, will be exhibiting at the event at booth #1017.
The conference is the world’s foremost international scientific gathering for materials research, showcasing leading interdisciplinary research in both fundamental and applied areas, presented by scientists from around the world.
Materials analysis instrumentation from Rigaku ranges from benchtop devices, suited for researchers employing X-ray techniques, to high-end instruments with advanced analytical capabilities.
The sixth generation Rigaku MiniFlex benchtop X-ray diffraction instrument is on display at the event. The MiniFlex system is a general purpose X-ray diffractometer, able to perform qualitative and quantitative analysis of polycrystalline materials. The instrument is designed to deliver speed and sensitivity through innovative technology enhancements, such as the HyPix-400 MF 2D hybrid pixel array detector (HPAD) coupled with a 600 W X-ray source and 8-position automatic sample changer.
Also on exhibit during the meeting is the Rigaku Progeny 1064 nm-based handheld Raman analyzer, which will be available for in-booth demonstrations. The unit is designed for flexibility and ease of use to meet the needs of routine manufacturing and more intricate quality assurance applications.
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MiniFlex Benchtop XRD
Rigaku CorporationNew 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case