Bruker invites you to join application specialist Eric Klein in an upcoming webinar showing the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. This webinar will be provided as an on-demand webinar afterwards.
About the samples:
The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface. The second sample is a standard particle trap, which was used to understand contamination routes and prevent the reoccurence of particle contaminations. Register now!
In this webinar you'll learn:
Register now for the live event on Thu, Jun 4, 2020 3:00 PM - 4:00 PM BST